Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing

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Van-zeghbroeck , Principles of Semiconductor Devices. Richard , The explosive word of serial flash , Electronic Component News , Ditewig , An embedded 1.

Dubbele citaties

IEEE International , pp. Hamdioui, G. Gaydadjiev, and A. Van-de-goor , The state-of-art and future trends in testing embedded memories , Records of the International Workshop on Memory Technology, Design and Testing, Birolini , Reliability Engineering: Theory and Practice , Pavan, L. Larcher, and A. Wern and S. Eric , Reliability characterization of a 0. ICSE Degraeve , Analytical model for failure rate prediction due to anomalous charge loss of flash memories , International Electron Devices Meeting.

Larcher and P. Degraeve , Statistical model for stress-induced leakage current and pre-breakdown current jumps in ultra-thin oxide layers , International Electron Devices Meeting. Degreave , A new analytic model for the description of the intrinsic oxide breakdown statistics of ultra-thin oxides Reliability of Electron Devices, Failure Physics and Analysis , Proceedings of the 7th European Symposium on , pp. Salvo , Analysis of the electrical transport and reliability of floating gate non volatile memory insulators , Chimenton and P.

Olivo , Erratic erase in flash memories. Portal, H. Aziza, and D.

Dubbele citaties

ITC Neophytou , M. Thesberg , N. Neophytou, H. Sharma, S.

Conference Presentations

Tyaginov , S. Rauch, J. Kaczer, A. Vexler, T. Windbacher , A. Filipovic, A. Nedjalkov, C. Riddet, C. Alexander, L. Wang, V. Georgiev, A.

Day 2: ICE/IEEE International Conference on Engineering, Technology and Innovation 2018

Brown, C. Millar, A. Windbacher, S.

Nombre de citations par an

Windbacher , H. Mahmoudi, A. Sverdlov, T. Waltl, H. Pandey, S. Kataria, V. Passi, M. Lemme, T. Rzepa , M. Waltl, W.

Kaczer, J. Franco, T. Horiguchi, T.

ADS Bibliographic Codes: Conference Proceedings Abbreviations

Waltl, J. Filipovic , S. Papaleo , M.

Rovitto, H. Rovitto , H. Ceric , R. Lacerda de Orio, M. Singulani , F.

Roger, S. Carniello, S. Windbacher, V. Rupp , A. Morhammer, T. Grasser, A. Giering , G. Rott, G. Rzepa, H. Reisinger, A. Puppala, T. Reich, W. Grasser, R. Rzepa, W. Wimmer, A. El-Sayed, A. Shluger, H. Papaleo , H. Waltl, A. Mitard, T. Ghosh, A.